New Techniques for Impedance Characteristics Measurement of Islanded Microgrid based on Stability Analysis
Vol. 16, No. 3, pp. 1163-1175, May 2016
10.6113/JPE.2016.16.3.1163
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Cite this article
[IEEE Style]
L. Hou, F. Zhuo, H. Shi, "New Techniques for Impedance Characteristics Measurement of Islanded Microgrid based on Stability Analysis," Journal of Power Electronics, vol. 16, no. 3, pp. 1163-1175, 2016. DOI: 10.6113/JPE.2016.16.3.1163.
[ACM Style]
Lixiang Hou, Fang Zhuo, and Hongtao Shi. 2016. New Techniques for Impedance Characteristics Measurement of Islanded Microgrid based on Stability Analysis. Journal of Power Electronics, 16, 3, (2016), 1163-1175. DOI: 10.6113/JPE.2016.16.3.1163.