The Effect of Series and Shunt Redundancy on Power Semiconductor Reliability

Mohsen Hasan Babayi Nozadian; Mohammad Shadnam Zarbil; Mehdi Abapour

The Effect of Series and Shunt Redundancy on Power Semiconductor Reliability

Mohsen Hasan Babayi Nozadian

Mohammad Shadnam Zarbil

Mehdi Abapour

Vol. 16, No. 4, pp. 1426-1437, Jul. 2016

10.6113/JPE.2016.16.4.1426

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Abstract

In different industrial and mission oriented applications, redundant or standby semiconductor systems can be implemented to improve the reliability of power electronics equipment. The proper structure for implementation can be one of the redundant or standby structures for series or parallel switches. This selection is determined according to the type and failure rate of the fault. In this paper, the reliability and the mean time to failure (MTTF) for each of the series and parallel configurations in two redundant and standby structures of semiconductor switches have been studied based on different failure rates. The Markov model is used for reliability and MTTF equation acquisitions. According to the different values for the reliability of the series and parallel structures during SC and OC faults, a comprehensive comparison between each of the series and parallel structures for different failure rates will be made. According to the type of fault and the structure of the switches, the reliability of the switches in the redundant structure is higher than that in the other structures. Furthermore, the performance of the proposed series and parallel structures of switches during SC and OC faults, results in an improvement in the reliability of the boost dc/dc converter. These studies aid in choosing a configuration to improve the reliability of power electronics equipment depending on the specifications of the implemented devices.

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Cite this article

[IEEE Style]

M. H. B. Nozadian, M. S. Zarbil, M. Abapour, "The Effect of Series and Shunt Redundancy on Power Semiconductor Reliability," Journal of Power Electronics, vol. 16, no. 4, pp. 1426-1437, 2016. DOI: 10.6113/JPE.2016.16.4.1426.

[ACM Style]

Mohsen Hasan Babayi Nozadian, Mohammad Shadnam Zarbil, and Mehdi Abapour. 2016. The Effect of Series and Shunt Redundancy on Power Semiconductor Reliability. Journal of Power Electronics, 16, 4, (2016), 1426-1437. DOI: 10.6113/JPE.2016.16.4.1426.