A Solid State Controller for Self-Excited Induction Generator for Voltage Regulation, Harmonic Compensation and Load Balancing


Vol. 5, No. 2, pp. 109-119, Apr. 2005
10.6113/JPE.2005.5.2.109


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 Abstract

This paper deals with the performance analysis of static compensator (STATCOM) based voltage regulator for self-excited induction generators (SEIGs) supplying balanced/unbalanced and linear/ non-linear loads. In practice, most of the loads are linear. But the presence of non-linear loads in some applications injects harmonics into the generating system. Because an SEIG is a weak isolated system, these harmonics have a great effect on its performance. Additionally, SEIG’s offer poor voltage regulation and require an adjustable reactive power source to maintain a constant terminal voltage under a varying load. A three-phase insulated gate bipolar transistor (IGBT) based current controlled voltage source inverter (CC-VSI) known as STATCOM is used for harmonic elimination. It also provides the required reactive power an SEIG needs to maintain a constant terminal voltage under varying loads. A dynamic model of an SEIG-STATCOM system with the ability to simulate varying loads has been developed using a stationary d-q axes reference frame. This enables us to predict the behavior of the system under transient conditions. The simulated results show that by using a STATCOM based voltage regulator the SEIG terminal voltage can be maintained constant and free from harmonics under linear/non linear and balanced/unbalanced loads.


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Cite this article

[IEEE Style]

B. Singh, S. S. Murthy, S. Gupta, "A Solid State Controller for Self-Excited Induction Generator for Voltage Regulation, Harmonic Compensation and Load Balancing," Journal of Power Electronics, vol. 5, no. 2, pp. 109-119, 2005. DOI: 10.6113/JPE.2005.5.2.109.

[ACM Style]

Bhim Singh, S. S. Murthy, and Sushma Gupta. 2005. A Solid State Controller for Self-Excited Induction Generator for Voltage Regulation, Harmonic Compensation and Load Balancing. Journal of Power Electronics, 5, 2, (2005), 109-119. DOI: 10.6113/JPE.2005.5.2.109.