Minimization of Voltage Stress across Switching Devices in the Z-Source Inverter by Capacitor Voltage Control

Quang-Vinh Tran; Tae-Won Chun†; Heung-Gun Kim; Eui-Cheol Nho

Minimization of Voltage Stress across Switching Devices in the Z-Source Inverter by Capacitor Voltage Control

Vol. 9, No. 3, pp. 335-342, May 2009

10.6113/JPE.2009.9.3.335

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Abstract

The Z-source inverter (ZSI) provides unique features such as the ability to boost dc voltage with a single stage simple structure. Although the dc capacitor voltage can be boosted by a shoot-through state, the voltage stress across the switching devices is rapidly increased, so high switching device power is required at the ZSI. In this paper, algorithms for minimizing the voltage stress are suggested. The possible operating region for obtaining a desired ac output voltage according to both the shoot-through time and active state time is investigated. The reference capacitor voltages are derived for minimizing the voltage stress at any desired ac output voltage by considering the dc input voltage. The proposed methods are carried out through the simulation studies and experiments with 32-bit DSP.

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Cite this article

[IEEE Style]

Q. Tran, T. Chun†, H. Kim, E. Nho, "Minimization of Voltage Stress across Switching Devices in the Z-Source Inverter by Capacitor Voltage Control," Journal of Power Electronics, vol. 9, no. 3, pp. 335-342, 2009. DOI: 10.6113/JPE.2009.9.3.335.

[ACM Style]

Quang-Vinh Tran, Tae-Won Chun†, Heung-Gun Kim, and Eui-Cheol Nho. 2009. Minimization of Voltage Stress across Switching Devices in the Z-Source Inverter by Capacitor Voltage Control. Journal of Power Electronics, 9, 3, (2009), 335-342. DOI: 10.6113/JPE.2009.9.3.335.