Risk assessment of aviation DC series arc based on reconstructed CBAM‑CNN

Haoqi Yang; Cong Gao; Hongjuan Ge; Yiqin Sang; Yongshuai Wang

Risk assessment of aviation DC series arc based on reconstructed CBAM‑CNN

Vol. 23, No. 5, pp. 811-820, May 2023

10.1007/s43236-022-00575-y

Risk Assessment

Feature evaluation function

Reconstructed CBAM-CNN

Sustained arc

Un-sustained arc

Abstract

The hazards of sustained arc and un-sustained arc are different. However, during the stage of arc development, there is a lack of effective methods to identify them, which is not conducive to the timely accurate assessment of arc risk. Therefore, this paper proposes a risk assessment method for aviation DC series arc based on a reconstructed CBAM-CNN. First, in the process of generating the feature set, a feature evaluation function is defined to screen the features. Then the existing convolution block attention module (CBAM) is improved by adding a reshaped layer and redefining spatial attention, which results in the reconstructed CBAM-CNN. Finally, the reconstructed CBAM-CNN takes the feature set as its input and output arc risk assessment results on the basis of enhancing the attention of important features. The validity of the reconstructed CBAM-CNN method is verified on an aviation DC arc generation platform. It is found that the proposed method has a higher training efficiency and evaluation accuracy than the CNN method and CBAM-CNN method. In addition, the reconstructed CBAM-CNN involves fewer parameters to be measured, which can reduce its dependence on computing resources.

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Cite this article

[IEEE Style]

H. Yang, C. Gao, H. Ge, Y. Sang, Y. Wang, "Risk assessment of aviation DC series arc based on reconstructed CBAM‑CNN," Journal of Power Electronics, vol. 23, no. 5, pp. 811-820, 2023. DOI: 10.1007/s43236-022-00575-y.

[ACM Style]

Haoqi Yang, Cong Gao, Hongjuan Ge, Yiqin Sang, and Yongshuai Wang. 2023. Risk assessment of aviation DC series arc based on reconstructed CBAM‑CNN. Journal of Power Electronics, 23, 5, (2023), 811-820. DOI: 10.1007/s43236-022-00575-y.