Temperature field and demagnetization analysis of in‑wheel motors based on magneto‑thermal two‑way coupling


Vol. 24, No. 2, pp. 227-238, Feb. 2024
10.1007/s43236-023-00718-9




 Abstract

Due to the narrow working space of an in-wheel motor, the heat generated by the motor loss is difficult to dissipate. This makes it easier for the in-wheel motor to demagnetize the permanent magnet due to the mega-temperature, which affects the output efficiency. To solve this problem, an external rotor hub motor is studied. First, in accordance with the theory of magnetic field modulation, the in-wheel motor to be studied is designed. By analyzing the electromagnetic characteristics of the motor, the correctness of the motor design is verified, and the losses of the motor under different working conditions are calculated. To acquire a more rigorous temperature increase record, the magnetic-thermal bidirectional coupling method is utilized to analyze the temperature field under different load conditions. The mechanism of the demagnetization of permanent magnets is analyzed, and demagnetization at different temperatures is obtained by magneto-thermal two-way coupling. Research shows that when the motor is overloaded for a long time, the temperature can reach a maximum of 220 °C. At this temperature, the permanent magnet undergoes irreversible demagnetization, which results in a 93.44% decrease in torque. Finally, temperature increase tests of a permanent magnet motor are carried out to verify the validity of the magneto-thermal two-way coupling analysis.


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Cite this article

[IEEE Style]

X. Wang, J. Zhang, C. Qu, C. Zhou, "Temperature field and demagnetization analysis of in‑wheel motors based on magneto‑thermal two‑way coupling," Journal of Power Electronics, vol. 24, no. 2, pp. 227-238, 2024. DOI: 10.1007/s43236-023-00718-9.

[ACM Style]

Xiuping Wang, Jiawei Zhang, Chunyu Qu, and Chuqiao Zhou. 2024. Temperature field and demagnetization analysis of in‑wheel motors based on magneto‑thermal two‑way coupling. Journal of Power Electronics, 24, 2, (2024), 227-238. DOI: 10.1007/s43236-023-00718-9.