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Junction Temperature Estimation Approach Based on TSEPs in Multichip IGBT Modules
Jianxiong Yang Yanbo Che Li Ran Borong Hu Mingxing Du
Vol. 22, No. 9, pp. 1596-1605, Sep. 2022
10.1007/s43236-022-00465-3
Vol. 22, No. 9, pp. 1596-1605, Sep. 2022
10.1007/s43236-022-00465-3
Short‑circuit and open‑circuit faults monitoring of IGBTs in solid‑state‑transformers using collector‑emitter voltage
Qiuling Cao Yanbo Che Jianxiong Yang Menglai Mi Yaoyao Men
Vol. 21, No. 7, pp. 1052-1060, Jul. 2021
10.1007/s43236-021-00232-w
Vol. 21, No. 7, pp. 1052-1060, Jul. 2021
10.1007/s43236-021-00232-w