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Real-time test-bed system development using power hardware-in-the-loop (PHIL) simulation technique for reliability test of DC nano grid
Kyung-Wook Heo Hyun-Jun Choi Jee-Hoon Jung
Vol. 20, No. 3, pp. 784-793, May 2020
10.1007/s43236-020-00075-x
Vol. 20, No. 3, pp. 784-793, May 2020
10.1007/s43236-020-00075-x
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