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Search: "[ keyword: Degradation ]" (4)
Impact of decoupling capacitor aging and temperature for the long‑term reliability of power delivery networks
Maurizio Di Nella Francesco de Paulis Carlo Olivieri Antonio Orlandi
Vol. 24, No. 10, pp. 1650-1659, Oct. 2024
10.1007/s43236-024-00904-3
Vol. 24, No. 10, pp. 1650-1659, Oct. 2024
10.1007/s43236-024-00904-3
SiC IGBT degradation mechanism investigation under HV‑H3TRB tests
Ziming Wu Zongbei Dai Jian Zhou Huafeng Dong Wencan Wang
Feiwan Xie Haoran Wang Jiahui Yan Xiyu Chen Shaohua Yang
Fugen Wu
Vol. 24, No. 2, pp. 305-315, Feb. 2024
10.1007/s43236-023-00726-9
Feiwan Xie Haoran Wang Jiahui Yan Xiyu Chen Shaohua Yang
Fugen Wu
Vol. 24, No. 2, pp. 305-315, Feb. 2024
10.1007/s43236-023-00726-9
Power metallization degradation monitoring on power MOSFETs by means of concurrent degradation processes
Sergio De Gasperi Michael Nelhiebel Dieter Haerle Andrea Baschirotto
Vol. 22, No. 9, pp. 1587-1595, Sep. 2022
10.1007/s43236-022-00463-5
Vol. 22, No. 9, pp. 1587-1595, Sep. 2022
10.1007/s43236-022-00463-5
Power electronic converter reliability and prognosis review focusing on power switch module failures
Ahmed Abuelnaga Mehdi Narimani Amir Sajjad Bahman
Vol. 21, No. 6, pp. 865-880, Jun. 2021
10.1007/s43236-021-00228-6
Vol. 21, No. 6, pp. 865-880, Jun. 2021
10.1007/s43236-021-00228-6
ISSN : 1598 - 2092
eISSN : 2093 - 4718