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Impact of decoupling capacitor aging and temperature for the long‑term reliability of power delivery networks
Maurizio Di Nella Francesco de Paulis Carlo Olivieri Antonio Orlandi
Vol. 24, No. 10, pp. 1650-1659, Oct. 2024
10.1007/s43236-024-00904-3
Vol. 24, No. 10, pp. 1650-1659, Oct. 2024
10.1007/s43236-024-00904-3
Overview of charging technology evolution in smartphones
ISSN : 1598 - 2092
eISSN : 2093 - 4718