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Search: "[ keyword: Temperature ]" (26)
Optimized junction temperature fluctuation suppression technique for SiC MOSFETs in a wireless charging system
Ruoyin Wang  Xueliang Huang  Jiacheng Li
Vol. 22, No. 5, pp. 859-869, May  2022
10.1007/s43236-022-00393-2
Reactive compensation of long primary HTS‑linear synchronous machines
Keyu Guo  Yaohua Li  Liming Shi  Yumei Du
Vol. 22, No. 5, pp. 796-808, May  2022
10.1007/s43236-022-00402-4
Permanent magnet temperature estimation of high power density permanent magnet synchronous machines by considering magnetic saturation
Jian Gao  Chengxu Li  Wenjuan Zhang  Shoudao Huang
Vol. 21, No. 12, pp. 1804-1811, Dec. 2021
10.1007/s43236-021-00314-9
Junction temperature measurement method for IGBTs using turn‑on miller plateau duration
Chunsheng Guo  Shiwei Zhang  Lei Wei  Hao Li  Sijin Wang 
Konggang Zhu
Vol. 21, No. 9, pp. 1374-1382, Sep. 2021
10.1007/s43236-021-00275-z
Online monitoring of IGBT junction temperature based on Vce measurement
Han Cao  Puqi Ning  Xiaoguang Chai  Dan Zheng  Yuhui Kang 
Xuhui Wen
Vol. 21, No. 2, pp. 451-463, Feb. 2021
10.1007/s43236-020-00178-5
Temperature characteristics of vehicle motors under extreme variable working conditions
Lian-Ge He  Wen-Jun Shi
Vol. 21, No. 2, pp. 376-383, Feb. 2021
10.1007/s43236-020-00191-8
Numerical junction temperature calculation method for reliability evaluation of power semiconductors in power electronics converters
Xiao Du  Xiong Du  Jun Zhang  Gaoxian Li
Vol. 21, No. 1, pp. 184-194, Jan. 2021
10.1007/s43236-020-00154-z
New SOC estimation method under multi‑temperature conditions based on parametric‑estimation OCV
Qiuting Wang  Wei Qi
Vol. 20, No. 2, pp. 614-623, Mar. 2020
10.1007/s43236-020-00036-4
An Estimation Method for the Efficiency of Light-Emitting Diode (LED) Devices
Xuehui Tao  Bin Yang  Bin Yang
Vol. 16, No. 2, pp. 815-822, Mar. 2016
10.6113/JPE.2016.16.2.815
Loss Analysis and Comparison of High Power Semiconductor Devices in 5MW PMSG MV Wind Turbine Systems
Kihyun Lee  Yongsug Suh  Yongcheol Kang
Vol. 15, No. 5, pp. 1380-1391, Sep. 2015
10.6113/JPE.2015.15.5.1380

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  ISSN : 1598 - 2092
eISSN : 2093 - 4718