Model prediction‑based switch open‑circuit fault diagnosis and localization for MMCs

Zehao Liu; Lan Xiao

Model prediction‑based switch open‑circuit fault diagnosis and localization for MMCs

Zehao Liu

Lan Xiao

Vol. 25, No. 12, pp. 2226-2238, Dec. 2025

10.1007/s43236-025-01051-z

Modular multilevel converter

Capacitor voltage prediction model

Model prediction algorithm

Switch opencircuit fault

Abstract

In this paper, a model prediction-based switch open-circuit fault diagnosis and location (FDL) method for modular multilevel converters (MMCs) is proposed. It mainly consists of a submodule (SM) capacitor voltage prediction model (CVPM). With the CVPM, the predicted capacitor voltage can be obtained via the arm current and the modified switching function. By comparing the predicted capacitor voltage with a sensor measured value, single or multiple switch faults can be located in time. In addition, for the first time, a CVPM is established to quantitatively characterize faulty SM capacitor voltage when two switches in a SM are simultaneously open-circuited. The FDL method has ability to identify an implicit failure state, which is not different from normal SMs. Finally, the proposed FDL method and CVPM are validated through simulation and experimental results.

Statistics

Show / Hide Statistics

Cumulative Counts from September 30th, 2019
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.

Cite this article

[IEEE Style]

Z. Liu and L. Xiao, "Model prediction‑based switch open‑circuit fault diagnosis and localization for MMCs," Journal of Power Electronics, vol. 25, no. 12, pp. 2226-2238, 2025. DOI: 10.1007/s43236-025-01051-z.

[ACM Style]

Zehao Liu and Lan Xiao. 2025. Model prediction‑based switch open‑circuit fault diagnosis and localization for MMCs. Journal of Power Electronics, 25, 12, (2025), 2226-2238. DOI: 10.1007/s43236-025-01051-z.

Advanced Search ▼