Ringing Frequency Extraction Method Based on EMD and FFT for Health Monitoring of Power Transistors
Vol. 19, No. 1, pp. 307-315, Jan. 2019
10.6113/JPE.2019.19.1.307
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Cite this article
[IEEE Style]
L. Ren and C. Gong, "Ringing Frequency Extraction Method Based on EMD and FFT for Health Monitoring of Power Transistors," Journal of Power Electronics, vol. 19, no. 1, pp. 307-315, 2019. DOI: 10.6113/JPE.2019.19.1.307.
[ACM Style]
Lei Ren and Chunying Gong. 2019. Ringing Frequency Extraction Method Based on EMD and FFT for Health Monitoring of Power Transistors. Journal of Power Electronics, 19, 1, (2019), 307-315. DOI: 10.6113/JPE.2019.19.1.307.