A Performance Comparison of the Current Feedback Schemes with a New Single Current Sensor Technique for Single-Phase Full-Bridge Inverters

Jung-Muk Choe; Young-Jin Lee; Younghoon Cho; Gyu-Ha Choe

A Performance Comparison of the Current Feedback Schemes with a New Single Current Sensor Technique for Single-Phase Full-Bridge Inverters

Vol. 16, No. 2, pp. 621-630, Mar. 2016

10.6113/JPE.2016.16.2.621

Current reconstruction

Digital control

Load current decoupling

Output impedance

UPS system

PDF

Abstract

In this paper, a single current sensor technique (SCST) is proposed for single-phase full-bridge inverters. The proposed SCST measures the currents of multiple branches at the same time, and reconstructs the average inductor, capacitor, and load current in a single switching cycle. Since all of the branches’ current in the LC filter and the load are obtained using the SCST, both the inductor and the capacitor current feedback schemes can be selectively applied while taking advantages of each other. This paper also analyzes both of the current feedback schemes from the view point of the closed-loop output impedance. The proposed SCST and the analysis in this paper are verified through experiments on a 3kVA single-phase uninterruptible power supply (UPS).

Statistics

Show / Hide Statistics

Cumulative Counts from September 30th, 2019
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.

Cite this article

[IEEE Style]

J. Choe, Y. Lee, Y. Cho, G. Choe, "A Performance Comparison of the Current Feedback Schemes with a New Single Current Sensor Technique for Single-Phase Full-Bridge Inverters," Journal of Power Electronics, vol. 16, no. 2, pp. 621-630, 2016. DOI: 10.6113/JPE.2016.16.2.621.

[ACM Style]

Jung-Muk Choe, Young-Jin Lee, Younghoon Cho, and Gyu-Ha Choe. 2016. A Performance Comparison of the Current Feedback Schemes with a New Single Current Sensor Technique for Single-Phase Full-Bridge Inverters. Journal of Power Electronics, 16, 2, (2016), 621-630. DOI: 10.6113/JPE.2016.16.2.621.