Investigation on Intermittent Life Testing Program for IGBT
Vol. 17, No. 3, pp. 811-820, May 2017
10.6113/JPE.2019.17.3.811
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Cite this article
[IEEE Style]
Y. Cheng, G. Fu, M. Jiang, P. Xue, "Investigation on Intermittent Life Testing Program for IGBT," Journal of Power Electronics, vol. 17, no. 3, pp. 811-820, 2017. DOI: 10.6113/JPE.2019.17.3.811.
[ACM Style]
Yu Cheng, Guicui Fu, Maogong Jiang, and Peng Xue. 2017. Investigation on Intermittent Life Testing Program for IGBT. Journal of Power Electronics, 17, 3, (2017), 811-820. DOI: 10.6113/JPE.2019.17.3.811.