Real-time test-bed system development using power hardware-in-the-loop (PHIL) simulation technique for reliability test of DC nano grid

Kyung-Wook Heo; Hyun-Jun Choi; Jee-Hoon Jung

Real-time test-bed system development using power hardware-in-the-loop (PHIL) simulation technique for reliability test of DC nano grid

Kyung-Wook Heo

Hyun-Jun Choi

Jee-Hoon Jung

Vol. 20, No. 3, pp. 784-793, May 2020

10.1007/s43236-020-00075-x

Power hardware-in-the-loop (PHIL) simulation

DC nano grid

DC bus signaling (DBS)

Grid power failure

DC/DC converter

AC/DC converter

Abstract

Since various power sources such as renewable energy and energy storage systems (ESSs) are connected to the DC grid, the reliability of the grid system is significant. However, the configuration of an actual DC grids for testing the reliability of the grid system is inconvenient, expensive and dangerous. In this paper, a test-bed system made up of a 20-kW DC nano grid and a control algorithm considering an external grid based on power hardware-in-the-loop (PHIL) simulation are proposed to demonstrate the reliability of the DC grid. Using the PHIL simulation technique, target grids can be safely implemented with laboratory-level instruments and simulated by real-time simulators, which emulates grid operations that are similar to the actual grid. In addition, using the proposed control algorithm, the operations of grid-connected converters are demonstrated according to the grid-connected or islanding modes. Finally, the reliability of the simulated DC nano grid and the effectiveness of the grid-connected converter are verified using the PHIL simulation system with 3-kW prototype converters.

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Cite this article

[IEEE Style]

K. Heo, H. Choi, J. Jung, "Real-time test-bed system development using power hardware-in-the-loop (PHIL) simulation technique for reliability test of DC nano grid," Journal of Power Electronics, vol. 20, no. 3, pp. 784-793, 2020. DOI: 10.1007/s43236-020-00075-x.

[ACM Style]

Kyung-Wook Heo, Hyun-Jun Choi, and Jee-Hoon Jung. 2020. Real-time test-bed system development using power hardware-in-the-loop (PHIL) simulation technique for reliability test of DC nano grid. Journal of Power Electronics, 20, 3, (2020), 784-793. DOI: 10.1007/s43236-020-00075-x.