Identification of failure modes in interior permanent magnet synchronous motor under accelerated life test based on dual sensor architecture
Vol. 24, No. 5, pp. 822-831, May 2024
10.1007/s43236-024-00810-8
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Cite this article
[IEEE Style]
S. Choi, J. Oh, J. Lee, W. Kwon, J. Lee, I. Hwang, J. Park, N. Kim, "Identification of failure modes in interior permanent magnet synchronous motor under accelerated life test based on dual sensor architecture," Journal of Power Electronics, vol. 24, no. 5, pp. 822-831, 2024. DOI: 10.1007/s43236-024-00810-8.
[ACM Style]
Sikgyeong Choi, Jaewook Oh, Juho Lee, Woyeong Kwon, Jeonghae Lee, Inhyeok Hwang, Jongbum Park, and Namsu Kim. 2024. Identification of failure modes in interior permanent magnet synchronous motor under accelerated life test based on dual sensor architecture. Journal of Power Electronics, 24, 5, (2024), 822-831. DOI: 10.1007/s43236-024-00810-8.