A Novel Interleaving Control Scheme for Boost Converters Operating in Critical Conduction Mode

Xu Yang; Yanping Ying; Wenjie Chen

A Novel Interleaving Control Scheme for Boost Converters Operating in Critical Conduction Mode

Xu Yang

Yanping Ying

Wenjie Chen

Vol. 10, No. 2, pp. 132-137, Mar. 2010

10.6113/JPE.2010.10.2.132

Critical conduction mode

Interleaving

Phase shift

Sub-harmonic oscillation

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Abstract

Interleaving techniques are widely used to reduce input/output ripples and to increase the power capacity of boost converters operating in critical conduction mode. Two types of phase-shift control schemes are studied in this paper, the turn-on time shifting method and the turn-off time shifting method. It is found that although the turn-off time shifting method exhibits better performance, it suffers from sub-harmonic oscillations at high input voltages. To solve this problem, an intensive quantitative analysis of the sub-harmonic oscillation phenomenon is made in this paper. Based upon that, a novel modified turn off time shifting control scheme for interleaved boost converters operating in critical conduction mode is proposed. An important advantage of this scheme is that both the master phase and the slave phase can operate stably in critical conduction mode without any oscillations in the full input voltage range. This method is implemented with a FPGA based digital PWM control platform, and tests were carried out on a two-phase interleaved boost PFC converter prototype. Experimental results demonstrated the feasibility and performance of the proposed phase-shift control scheme.

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Cite this article

[IEEE Style]

X. Yang, Y. Ying, W. Chen, "A Novel Interleaving Control Scheme for Boost Converters Operating in Critical Conduction Mode," Journal of Power Electronics, vol. 10, no. 2, pp. 132-137, 2010. DOI: 10.6113/JPE.2010.10.2.132.

[ACM Style]

Xu Yang, Yanping Ying, and Wenjie Chen. 2010. A Novel Interleaving Control Scheme for Boost Converters Operating in Critical Conduction Mode. Journal of Power Electronics, 10, 2, (2010), 132-137. DOI: 10.6113/JPE.2010.10.2.132.